專有名詞
A | Ampere | 安培 (電流單位) |
ADC | Analog to Digital Converter | 類比數位轉換器 |
ADSL | Asymmetric Digital Subscriber Line | 非對稱數位用戶迴路 |
AP | Access Point | 無線接入點 |
APON | ATM Passive Optical Network | ATM無源光網絡 |
APM | Assist PM | |
AQL | Accept Quality Level | 允收品質水準 |
A/S | Assembly | 組立 |
ASTM | American Society for Testing and Materials | 美國材料試驗協會 |
ATE | Automatic Test Equipment | 自動測試設備 |
ATM | Asynchronous Transfer Mode | 非同步傳輸模式 |
BAW | Bulk Acoustic Wave | 體聲波 |
BJT | Bipolar Junction Transistor | 雙載子接面電晶體 |
BME | Base Metal Electrode | 卑金屬電極 (MLCC的材料分類) |
BOSA | Bidirectional Optical Sub-Assembly | 雙向光學組裝件 |
BPON | Broadband Passive Optical Network | |
BW | Bandwidth | 頻寬 |
C | Capacitor ( Capacitance) | 電容器 (電容量) |
C | Coulomb | 庫倫 (電荷單位) (1C=1F x 1V = 1A x 1S) |
C0G | MLCC EIA Code ClassⅠ Type | MLCC EIA Code ClassⅠ的類別 |
CAR | Corrective Action Report | 矯正預防措施報告 |
CCM | Continuous-Conduction Mode | 連續導通模式 |
CIP | Continuous Improvement Plan | 持續改善計畫 |
CIS | Component Information Systems | 零件資訊系統 |
CML | Current Mode Logic | 電流模式邏輯 |
CMOS | Complementary Metal Oxide Semiconductor | 互補金屬氧化物半導化 |
CMRR | Common Mode Rejection Ratio | 共模抑制比 |
CNR | Centra Nonlinear Resistor | 壓敏電阻 (品牌舜全Centra) |
CPLD | Complex Programmable Logic Device | 複雜可程式化邏輯元件 |
CPS | Cyber-Physical System | 網宇實體系統 |
CSDI | Customer Service Defect Indentification | 客戶、服務、缺陷、識別 |
CoC | Code of Conduct | 行為準則 |
CPU | Central Processing Unit | 中央處理器 |
CTE | Coefficient of thermal expansion | 膨脹係數 |
CTR | Critical Temperature Resistance | 臨界溫度熱敏電阻 (或可稱玻璃態熱敏電阻) |
CTR | Current Transfer Ratio | 電流轉換比 |
DAC | Digital to Analog Converter | 數位類比轉換器 |
DCM | Discontinuous-Conduction Mode | 不連續導通模式 |
DCN | Design Change Notice | 設計變更通知 |
DDR SDRAM | Double Data Rate SDRAM (Synchronizes Dynamic Random Access Memory) | 雙倍資料率同步動態隨機存取記憶體 |
DF | Dissipation Factor | 消耗因子 |
DFA | Design For Assembly | 裝配性設計 (設計可製組裝) |
DFC | Design For Cost | 成本性設計 (成本導向設計) |
DFM | Design For Manufacturing | 製造性設計 (設計可製造性) |
DFT | Design For Testing | 測試性設計 (設計可測試) |
DUT | Device Under Test | 待測物 |
DOA | Dead On Arrival | 貨到客戶端於合約約定天數內損壞 |
DVT | Design Verification Test | 設計驗證測試 |
EAP | Enterprise Access Point | 企業級無線接入點 |
ECFA | Economic Cooperation Framework Agreement | 兩岸綜合性經濟合作協定或兩岸綜合經濟合作協定(英文譯名:Comprehensive Economic Cooperation Agreement, CECA |
ECN | Engineering Change Notice | 工程變更通知 |
ECR | Engineering Change Request | 工程變更需求 |
EDX | Energy Dispersive X-Ray Fluorescence Spectrometer | 能量分散式X光螢光光譜儀 |
EPLD | Electrically Probrammable Logical Device Erasable Probrammable Logical Device | 可擦除程式化邏輯元件 |
EEPROM | Electrically-Erasable Programmable Read-Only Memory | 電子抹除式可複寫唯讀記憶體 |
EMC | Electromagnetic Compatibility | 電磁相容 |
EMI | Electromagnetic Interference | 電磁干擾 |
EMS | ElectroMagnetic Susceptibility | 電磁耐受 |
EMS | Electronics Manufacturing Service | 電子製造服務 |
EPON | Ethernet Passive Optical Network | 乙太網路 PON |
ESD | Electrostatic Discharge | 靜電放電 |
ESL | Equivalent Series Inductance | 串聯等效電感 |
ESR | Equivalent Series Resistance | 串聯等效電阻 |
EuP | E co-Design Requirements for Energy U sing P roducts | 使用能源產品之環境化設計指令 |
ErP | Energy-related Products | 耗能相關產品指令 |
EVM | Error Vector Magnitude | 誤差向量振幅 |
EVT | Engineering Verifiction Test | 工程驗證測試 |
F | Farad | 法拉 (電容單位) |
F | Frequency | 頻率 |
F/T | Final Test | 終測 |
FAR | Failure Analysis Report | 不良分析報告 |
FMEA | Failure Mode & Effect Analysis | 失效模式與效應分析 |
FPGA | Field-Programmable Gate Array | 現場可程式化閘陣列 |
GP | 一般為 Sony Green partner簡稱GP | 此處說明為Green product 或Environmental Friendly Product |
GPIO | General Purpose Input/Output | Gigabit (高速) 被動式光纖網路 |
GPON | Gigabit capable Passive Optical Network | 通用型之輸入輸出 |
HALT | Highly Acceleration Life Test | 高加速壽命測試 |
HS | Hazardous Substance | 危害物質 |
HSF | Hazardous Substance Free | 無危害物質 |
I | Current | 電流 (I = V/R = P/V) |
I/N | Manual Insertion | 手插件 |
I2C | Inter-Integrated Circuit | 積體電路匯流排 |
IBIS | Input / Output Buffer Information Specification | 輸入輸出緩衝器資訊規範 |
IBP | Initial Business Plan | 初步的商業計劃書 |
ICE | In Circuit Emulator | 電路內部仿真器 |
ICL | Inrush Current Limit | 限制浪湧電流 |
ICT | In-Circuit Testing | 線上測試 |
IDT | InterDigital Transducer | 交指叉轉換器 |
IEEE | Institute of Electrical and Electric Engineers | 電機電子工程學會 |
IL | Insertion Loss | 插入損失 |
IR | Insulation Resistance | 絕緣阻抗 |
IR | Infrared Ray | 紅外線 |
IoT | Internet of Things | 物聯網 |
JEDEC | Joint Electron Device Engineering Council | 聯合電子管工程委員會 |
k | Thermal Conductivity | 導熱系數 |
L | Inductor 縮寫 | 電感縮寫 |
LAN | Local Area Network | 區域網路 |
LC | Leakage Current | 漏電流 |
LDO Regulator | Low Drop-Out regulator | 低壓降線性電源轉換 |
LDS | Loading sketch drawing | 零件位置圖 |
LED | Light-Emiting Doide | 發光二極體 |
LHPZ | Left Half-Plane Zero | 左半邊零點 |
LOI | Letter Of Intent | 合作意願書 |
LTB | Last Time Buy | 最終採購 |
LVCMOS | Low Voltage Complementary Metal Oxide Semiconductor | 低壓互補金屬氧化物半導化 |
LVDS | Low Voltage Differential Signal | 低壓差動訊號 |
LVPECL | Low Voltage Positive Emitter-Coupled Logic | 低電壓正發射極耦合邏輯 |
M2M | Machine-to-Machine | 機器對機器 |
MAC | Media Access Control | 媒介存取控制層 |
MDA | Manufacture Defect Analyzer | 製造缺陷分析系統 |
MDC | Management Data Clock | 管理數據時間 |
MDIO | Management Data Input/Output | 管理數據輸入/輸出 |
MEMS | Micro electromechanical system | 微機電系統 |
MLCC | Mult-Layer Ceramic Capacitor | 積層陶瓷電容 |
MOSFET | Metal-Oxide Semiconductor Field-Effect-Transistor | 金氧半場效電晶體 |
MOU | Memorandum Of Understanding | 備忘錄 |
MOV | Metal Oxide Varistor | 金屬氧化物壓敏電阻 |
MOQ | Minimum Order Quantity | 最少訂單數量 |
MP | Mass Production | 量產 |
MPS | Master Production Schedule | 主生產計劃 |
MRB | Material Review Board | 材料審查會議 |
MRP | Material Requirement Planing | 原料需求計劃 |
MSDS | Material Safety Data Sheet | 物質安全資料表 |
M.T.B.F | Mean Time Between Failure | 平均故障間隔時間 |
NDA | Non-Disclosure Agreement | 保密協議 |
NEBS | Network Equipment-Building System | 網絡設備構建系統 |
NME | Noble Metal Electrode | 貴金屬電極 (MLCC的材料分類) |
NPO | Negative Positive Zero | MLCC EIA Code ClassⅠ的類別 |
NRE | Non-Recurring Engineering Expense | 一次性工程費用 |
NTC | Negative Temperature Coefficient | 負溫度係數 |
NVRAM | Non-Volatile Random Access Memory | 非揮發性隨機存取記憶體 |
OAP | Outdoor Access Point | 戶外無線接入點 |
OCL | Open Circuit Inductance | 開路電感量 |
OCP | Over Current Protection | 過電流保護 |
OCXO | Oven Controlled Crystal Oscillator | 恆溫晶體振盪器 |
ODM | Original Design Manufacturer | 客戶設計委託生產 |
OEM | Original Equipment Manufacturer | 客戶設計委託生產 |
OSC | Oscillator | 振盪器 |
OTP | Over Temperature Protection | 過溫度保護 |
OVP | Over Voltage Protection | 過電壓保護 |
P | Power | 功率 (P=V * I =I2R) |
PCB | Printed Circuit Board | 印刷電路板 |
PCBA | Printed Circuit Board Assembly | 印刷電路板總成 |
PCI | peripheral component interconnect | 周邊零件連接 |
PCN | Product Change Notification | 零件變更通知 |
PCXO | Programmable Crystal Oscillator | 可程式化晶體振盪器 |
PDD | Product Description Document | 產品說明文檔 |
PECL | Positive Emitter-Coupled Logic | 正發射極耦合邏輯 |
PFM | Pulse Frequency Modulation | 脈沖頻率調變 |
PHY | Physical layer Device | 實體層 |
P/K | Packing | 包裝 |
PLL | Phase-Locked Loop | 鎖相迴路 |
PoE | Power Over Ethernet | 乙太網路供電 |
POR | Power On Reset | 開機重制 |
PSU | Power Supply Unit | 電源供應單元 (可簡稱為電源供應器) |
P/T | Preliminary Test | 初測 |
PTC | Positive Temperature Coefficient | 正溫度係數 |
PWM | Pulse Width Modulation | 脈衝寬度調變 |
QVL | Qualified Vendor List | 合格供應商名冊 |
QoS | Quality of Service | 服務品質 |
R | Resistor (Resistance) | 電阻 (電阻值) (R = V/I) |
RFIC | Radio Frequency Integrated Circuit | 射頻積體電路 |
RFID | Radio Frequency Identification | 無線射頻辨識 |
RFQ | Request For Quotation | 詢(報)價單 |
RHPZ | Right-Half-Plane Zero | 右半邊零點 |
RMA | Return Material Authorizations | 退貨授權 |
RL | Return Loss | 反射損失 |
RMS | Root Mean Square | 均方根值 |
RoHS | the R estriction O f the use of certain H azardous S ubstancesin electrical and electronic equipment) | 電子及電器設備禁用物質指令 |
ROI | Return On Investment | 投資回報率 |
ROSA | Receiver Optical Sub-Assembly | 光接收次組裝模組 |
RPS | Redundant Power Supply | 冗餘 (備用) 電源 |
RTC | Real Time Clock | 實時時鐘 |
SAW | Surface Acoustic Wave | 表面聲波 |
SDRAM | Synchronous Dynamic Random Access Memor | 同步動態隨機存取記憶體 |
SGMII | Serial Giga Media Independent Interface | 串列Giga介質無關介面 |
SG | Smart Grid | 智慧電網 |
SI | Signal Integrity | 訊號完整度 |
SMD | Surface Mount Device | 表面黏著元件 |
SMPS | Switching Mode Power Supply | 切換式電源供應器 |
SMT | Surface Mount Technology | 表面黏著技術 |
SMI | Serial Management Interface | 串列管理介面 |
SFP | SSmall Form-factor Pluggables | 小型熱插拔 |
SOP | Standard Operatiion Procedure | 標準作業指導書 |
SOW | Statement for Work | 工作說明書 |
SPS | Source Power Supply | (主要)電源供應器 |
T/U | Touch up | solder補焊 |
TDR | Time Domain Reflectometry | 時間區域反射法 |
THT | Through Hole Technology | 穿孔插件技術 |
TIE | Time Interval Error | 時間間隔誤差 |
TNR | Toshiba Non-linear Resistor | 東芝公司的非線性電阻 (壓敏電阻的一種) |
TRD | Test Requirement Document | 測試需求文檔 |
TOSA | Transmitter Optical Sub-Assembly | 光接發射組裝模組 |
UART | Universal Asynchronous receiver Transmitter | 通用非同步收發傳輸器 |
USB | Universal Serial Bus | 萬用串列匯流排 |
V | Volt | 福特 (電壓單位) |
V | Voltage | 電壓 (V = I x R = P/I) |
Varistor | Variable(會變的)+ Resistor(電阻) | 壓敏電阻 |
VCSO | Voltage Controlled SAW Oscillator | 壓控表面波聲體振盪器 |
VCTCXO | Voltage Controlled/ Temperature Compensated Crystal Oscillator | 壓控溫度補償晶體振盪器 |
VCXO | Voltage Controlled Crystal Oscillator | 壓控晶體振盪器 |
VDR | Voltage Dependent Resistor | 壓敏電阻 |
VDSL | Very-high-bit-rate Digital Subscriber Line | 超高速數位用戶迴路 |
W | Watt | 瓦特 (功率單位) = 1焦耳/秒 |
WAN | Wide Area Network | 寬域網路 |
WDT | Watch Dog Timer | 看門狗 (監視時間器) |
WEEE | Waste Electrical and Electronic Equipment | 電子及電器設備廢棄物處理指令 |
Wi-Fi | Wireless Fidelity | 無線聯網的技術 |
WiMAX | Worldwide Interoperability for Microwave Access | 全球互通微波存取 |
WSN | Wireless Sensor Network | 無線傳感器網絡 |
X5R | MLCC EIA Code Class ⅡType | MLCC EIA Code ClassⅠ的類別 |
X7R | MLCC EIA Code Class ⅡType | MLCC EIA Code ClassⅠ的類別 |
X'tal | Crystal | 石英晶體 |
xDSL | X-Digital Subscriber Line | x 數位用戶迴路 |
XO | Crystal Oscillator | 石英振盪器 |
XUAI | 10Gigabit Attachment Unit Interface | 10千兆位連接單元接 |
Y5V | MLCC EIA Code Class ⅡType | MLCC EIA Code ClassⅠ的類別 |
Z | Impedance | 阻抗 (Ω) |
Z5U | MLCC EIA Code Class ⅡType | MLCC EIA Code ClassⅠ的類別 |
ZNR | Zinc-Oxide Non-linear Resistor | 氧化鋅非線性電阻 (壓敏電阻的類別) |
ZOV | Zinc-Oxide Varistor | 氧化鋅壓敏電阻 |